XH1 High-Purity Single-Crystal Silicon Squares for SEM, AFM, XPS & XRD
Price range: $2.00 through $98.00
High-Purity Single-Crystal Silicon Squares for SEM, AFM, XPS & XRD
Product Description
High-purity single-crystal silicon squares are designed for laboratory
surface analysis, microscopy, spectroscopy, thin-film deposition and
semiconductor research applications.
The silicon substrates are available in CZ (Czochralski) and FZ
(Float Zone) single-crystal material. P-type, N-type and intrinsic
silicon options can be supplied with different crystal orientations,
resistivity ranges and substrate thicknesses.
The polished silicon surface provides a flat and smooth substrate
suitable for SEM, AFM, XPS, XRD and related analytical techniques.
Square dimensions can be customized according to experimental
requirements.
Technical Parameters
| Material | Single-Crystal Silicon |
| Surface Finish | Single-Side Polished |
| Crystal Growth Method | CZ (Czochralski) / FZ (Float Zone) |
| Parent Wafer Size | 1–12 Inch |
| Standard Thickness | 525 μm / 625 μm / 725 μm |
| Custom Thickness | 50 μm – 12 mm |
| P-Type | Boron (B) Doped |
| N-Type | Phosphorus (P), Arsenic (As), Antimony (Sb) Doped |
| Intrinsic Silicon | FZ Intrinsic Silicon Available |
| Crystal Orientation | (100) / (110) / (111) |
| Resistivity | Approx. 0.0001 – 100,000 Ω·cm |
| Square Size | Custom Sizes Available |
Surface & Geometry Specifications
| TIR | < 3 μm |
| TTV | < 10 μm |
| BOW | < 10 μm |
| Surface Roughness | < 0.5 nm |
| Particle Count | < 10 particles for size > 0.3 μm |
Product Features
- High-purity single-crystal silicon substrate
- Single-side polished surface
- CZ and FZ silicon material available
- P-type, N-type and intrinsic silicon options
- (100), (110) and (111) crystal orientations
- Wide resistivity range available
- Low surface roughness for microscopy and surface analysis
- Custom square dimensions and thicknesses available
Applications
- SEM scanning electron microscopy substrates
- AFM atomic force microscopy substrates
- XPS surface analysis substrates
- XRD analysis
- PVD thin-film deposition
- CVD thin-film deposition
- Magnetron sputtering
- Infrared spectroscopy
- Fluorescence spectroscopy
- Ultra-flat laboratory substrates
- Molecular beam epitaxy (MBE) research
- Semiconductor and crystal materials research
Customization
Silicon squares can be supplied in different dimensions, thicknesses,
conductivity types, dopants, crystal orientations and resistivity
ranges according to customer requirements.
For quotation, please provide the required square size, thickness,
crystal orientation, conductivity type, dopant and resistivity range.
| Size | 10X10 MM Silicon Square / 300 NM SiO2, 10X10 MM Silicon Square / AFM-PFM / Precision Polished / 1 PC, 10X10 MM Silicon Square / SEM-XPS / 1 PC, 10X10 MM Silicon Square / SEM-XPS / 20 PCS, 10X10X1 MM Silicon Square / XRD / No Diffraction Peak, 15X15 MM Silicon Square / AFM-PFM / Precision Polished / 1 PC, 15X15 MM Silicon Square / SEM-XPS / 1 PC, 15X15 MM Silicon Square / SEM-XPS / 20 PCS, 20X20 MM Silicon Square / AFM-PFM / Precision Polished / 1 PC, 20X20 MM Silicon Square / SEM-XPS / 1 PC, 20X20 MM Silicon Square / SEM-XPS / 20 PCS, 20X20X1 MM Silicon Square / XRD / No Diffraction Peak, 25X25 MM Silicon Square / SEM-XPS / 1 PC, 30X30 MM Silicon Square / SEM-XPS / 1 PC, 3X3 MM Silicon Square / 1 PC, 3X3 MM Silicon Square / AFM-PFM / Precision Polished / 1 PC, 3X3 MM Silicon Square / SEM-XPS / 20 PCS, 40X40 MM Silicon Square / SEM-XPS / 1 PC, 50X50 MM Silicon Square / SEM-XPS / 1 PC, 5X5 MM Silicon Square / 1 PC, 5X5 MM Silicon Square / 300 NM SiO2, 5X5 MM Silicon Square / AFM-PFM / Fine Polished / 1 PC, 5X5 MM Silicon Square / SEM-XPS / 20 PCS, 8X8 MM Silicon Square / AFM-PFM / Precision Polished / 1 PC |
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